New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Perovskite solar cells have garnered widespread attention as a low-cost, high-efficiency alternative to conventional silicon ...

Atomic force microscopy (AFM) is a technique originally developed to assess the physical and mechanical properties of materials at extremely high resolutions, but the imaging speeds aren't fast enough ...

The research introduces a 3D approach to visualize electrical properties in perovskite films, paving the way for enhanced ...

Researchers at Oak Ridge National Laboratory used specialized tools to study materials at the atomic scale and analyze ...

Researchers at the Ningbo Institute of Materials Technology and Engineering (NIMTE), part of the Chinese Academy of Sciences, ...

How flu viruses enter cells has been directly observed thanks to a new microscopy technique with the potential to revolutionize research on membrane biology, virus–host interactions and drug discovery ...

Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...